Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
Complex SOCs areincreasingly tested in a modular fashion, which enables us torecord the yield-per-module. In this paper, we consider theyield-per-module as the pass probability of the module smanufacturing test. We use it to exploit the abort-on-fail featureof ATEs, in order to reduce the expected test application time. Wepresent a model for expected test application time, which obtainsincreasing