X-ray coherent diffraction imaging with an objective lens : Towards three-dimensional mapping of thick polycrystals
We demonstrate an X-ray coherent imaging method that combines high spatial resolution with the ability to map grains within thick polycrystalline specimens. An X-ray objective serves to isolate an embedded grain. Iterative oversampling routines and Fourier synthesis are used to reconstruct the shape and strain field from the far-field intensity pattern. In a demonstration experiment a ∼500-nm Pt g
