On crystal structure imaging of silicalite by HREM
High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with a 400-kV EM with a resolution of 1.6 Å. The images contain a dark contrast in the centers of the main channels, where there are no atoms. This contrast is an artifact and is not appreciable in the HREM images which have been published so far. That this problem can be overcome by choosing the proper
