A new quantitative X-ray system for micro-PIXE analysis
Particle Induced X-ray Emission is a well-established technique for quantitative elemental analysis down to trace levels. During microbeam analysis, where the beam is collimated and focused into a small spot, the beam current reduces to nA or less. The generation of characteristic X-rays is reduced in the same proportion, leading to long data-acquisition times. This can partly be compensated for b
