Surface Chemistry and Electrical properties of nanowire devices
Surface chemistry and electrical properties of InAs and InP III-V semiconductor nanowires and nanowire based devices were studied using Scanning Tunneling Microscopy (STM) and Spectroscopic Emission and Low Energy Electron Microscopy (SPELEEM). Changes of the surface as well as electrical properties in these devices as a function of annealing temperature under atomic hydrogen background were studi
