Charge Trapping and Defect Dynamics as Origin of Memory Effects in Metal Halide Perovskite Memlumors
Charge Trapping and Defect Dynamics as Origin of Memory Effects in Metal Halide Perovskite Memlumors | Division of Chemical Physics Skip to main content To Lund University Security and internal information (in Canvas, log-in required) Listen Search Search Division of Chemical Physics Department of Chemistry | Faculty of Science Listen Search Education Research Publications Staff Open positions Inf
https://www.chemphys.lu.se/ivan-scheblykin/publication/3a3a946c-8413-4c7c-b96a-83a0e41e5f11 - 2025-12-08
