Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses
It is shown that the high-resolution laser photoelectron microscope withsubwavelength-spatial resolution can be used for an absolute values ofthe two-photon external photoelectric effect measurements with high (afew nm-scale) localization. The spatial distribution of light intensityin the near field is studied by observing the photoelectron projectionimages of a subwavelength nanoaperture. The ima
