Study of Monitoring Circuitry for Ageing in FPGAs
Along with the down-scaling of CMOS technology, ageing has become one of the most important reliability challenges in CMOS devices. Ageing is defined as degradation in certain device characteristics such as delay, which can result in failure. Field Programmable Gate Arrays (FPGAs) are typically the first among the CMOS devices to adopt the latest technology. It is, therefore, crucial to tackle age